Xavier Jaurand

Directeur Technique CTµ

Laboratory : CTµ

Responsable des ressources

Critical point dryer Leica EM CPD

Materials preparation > Critical point dryer
auto freeze substitution Leica AFS 2

Materials preparation > Freezing > Substitution AFS
Cryo plunge

Materials preparation > Freezing
High pressure freezing device Leica EMPact

Materials preparation > Freezing > High pressure
High pressure freezing device Leica HPM100

Materials preparation > Freezing > High pressure
Fume chamber

Materials preparation > Fume Chamber
Coating system Baltec MED020

Materials preparation > Métalliseur
Coating system Balzers MED010

Materials preparation > Métalliseur
Reichert-Jung Supercut 2050 Microtome

Materials preparation > Microtome
Polishing machine Presi Mecatech 250
4 samples
250 mm Plate
40/25 mm plot
Materials preparation > Polishing machine
Ultramicrotome cryo Leica UC7

Materials preparation > Ultramicrotome
Ultramicrotome cryo Reichert Ultracut S

Materials preparation > Ultramicrotome
Ultramicrotome Reichert Ultracut E

Materials preparation > Ultramicrotome
FESEM FEI Quanta 250
Low vacuum
Environmental
Cryo (Gatan system)
Micro-analysis EDS
Microscopy > Electronic > Scanning > FEG
FESEM ZEISS Merlin compact
Micro-analysis EDS
Low vacuum
In-lens detector
Low voltage (deceleration system)
Topography (3DSM system)
Correlative (CLEM, Shuttle and Find system)
Microscopy > Electronic > Scanning > FEG
TEM FEG JEOL 2100F
Micro-analysis EDS
STEM-HAADF
Diffraction (SAED)
Tomography (3D)
High resolution (HRTEM)
Microscopy > Electronic > Transmission > FEG
TEM JEOL 1400 Flash LaB6
cryo-TEM
Microscopy > Electronic > Transmission > LaB6
TEM Philips CM120
Cryo (Gatan system)
Micro-analysis EDX/EDS (X-rays)
Microscopy > Electronic > Transmission > W
Microscope confocal LSM800
Correlative (CLEM)
Thermo-regulated
3D Reconstruction
Microscopy > Optic > Confocal > Mono-photon

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