optical profilometer ALTISURF 520
Optical profilometer to measure surface geometry, thickness of transparent layer and roughness. Measurement area 200x200 millimeters. Accuracy of a few microns along the whole measurement area. Height range depending on the sensor used, up to a few millimeters. Roughness can be measured for Ra in the range 0.1 to a few microns.
Contact Task Facility Manager (TFM)
0695106902
Depending structure
Other's Laboratory/Plateforme
Laboratory : Cristalinnov
Depending structure : UCBL1
Lab tutorship :
Lab tutorship :
UCBL
354 Voie Magellan
Bât. Cleanspace Parc d’activité Alpespace
73800 Sainte-Hélène-du-Lac
Full support : 
Continuous education :
Access with light support :
Open to academic :
Open to enterprises :
Continuous education :
Access with light support :
Open to academic :
Open to enterprises :
