Smartlab Rigaku multipurpose X-ray diffractometer

Equipement located at Ecole Centrale de Lyon à Ecully (INL-Nanolyon Bâtiment F7)

It is mainly dedicated to the study of thin layers or deposits (mono or polycrystalline). It makes it possible to measure the thickness of the layers, their orientation or the roughness at the interfaces. The techniques available on this device are high resolution diffraction, reflectometry, grazing incidence diffraction, texture measurements and reciprocal space mapping. It is also possible to perform measurement as a function of temperature.

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Depending structure

INL

Rue Enrico Fermi
69622 Villeurbanne
04 72 44 62 82

infos : Website

The goal of INL is to encourage world-leading multidisciplinary research in the areas of micro and nanotechnologies and their applications. The pioneering research undertaken at the Institute ranges from materials and technology to devices and systems, thus enabling the emergence of dedicated technologies. The Institute is supported in its work by the Nanolyon Technology Platform.

Other's Laboratory/Plateforme

NanoLyon

Regreny Philippe

Responsable Opérationnel Adjoint

Depending structure : INL
Federation :

FRAMA, C2I@L

Lab tutorship :

UCBL-CNRS-INSA-ECL-CPE

1 rue E. Fermi
Bâtiment Irène Joliot Curie
69622 Villeurbanne

Full support :
Continuous education :
Access with light support :

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Open to academic :
Open to enterprises :