D8 Advance X-ray diffractometer - High Resolution
- Reflectometry
- Reciprocical space mapping
- Texture measurement
- Grazing Incidence
- Powder Diffraction
- High Resolution
- Reflectometry
- Reciprocical space mapping
- Texture measurement
- Grazing Incidence
- Powder Diffraction
Crystallography > Diffractometer > X-ray diffraction > High Resolution > Reflectometry > Thin Films
The X-ray diffraction centre Henri Longchambon has four X-ray diffractometers. The Bruker D8 Discover Da Vinci is a high resolution setup with a large choice of optics. He is mainly dedicated to thin film measurements or deposited materials (both single and polycrystalline). He can be used for the determination of thin film thickness, orientation or surface roughness. The accessible techniques with this system are high-resolution diffraction, reflectometry, grazing-incidence diffraction, texture analysis and reciprocical space mapping.
Contact Task Facility Manager (TFM)
04 37 42 35 87
Depending structure
Other's Laboratory/Plateforme
Laboratory : Centre de Diffractométrie Henri Longchambon
Depending structure : UCBL1
Federation :
Lab tutorship :
Federation :
Lab tutorship :
UCBL
5 rue de la doua
Bât. ISA
69100 Villeurbanne
Full support : 
Continuous education :
Access with light support :
Open to academic :
Open to enterprises :
Continuous education :
Access with light support :
Open to academic :
Open to enterprises :
