AFM Park XE-70 - Contact
- Tapping
- Air
- Contact
- Tapping
- Air
Atomic Force Microscopy (AFM) to image surfaces or record force curves. Characterization of all kinds of samples (as long as the roughness of surface is lower or equal to 1 or 2 µm peak to peak). Size of the smallest objects which we can detect on surface: qq nm X and Y Height of the observable objects: from 0.5 to 500nm Size of the square images: from 100nmx100nm to 100µmx100µm Maximal size of the observable samples: diameter < 15mm or squared of 12mm aside, height < 5 mm In liquide or on the air Information given by the AFM: topographic, mechanical characterization
Contact Task Facility Manager (TFM)
0472448151
Depending structure
Other's Laboratory/Plateforme
Laboratory : Plateforme AFM-SFA
Depending structure : ILM Tech
Federation :
Lab tutorship :
Federation :
FRAMA
Lab tutorship :
UCBL/CNRS
Rue Ada Byron
Bâtiment Brillouin - Campus de la DOUA
69622 Villeurbanne
Full support : 
Continuous education :
Access with light support :
Open to academic :
Open to enterprises :
Continuous education :
Access with light support :
Open to academic :
Open to enterprises :
