AFM MFP 3D Asylum - Contact
- Tapping
- Electric mode
- Magnetic mode
- Air/Liquid
- Contact
- Tapping
- Electric mode
- Magnetic mode
- Air/Liquid
Atomic Force Microscopy (AFM) to image or to do force curves on surface. Characterization of all kinds of samples as long as the roughness of surface is lower or equal to 1 or 2 µm peak to peak. Size of the smallest objects which we can detect on surface: qq nm X and Y Height of the observable objects: from 0,5nm to 1µm Size of the square images: from 100nmx100nm to 90µmx90µm Maximal size of the observable samples: the one of a microscope slide, height < 5 mm Possibility of working in solution or on the air Information given by the AFM: topographic, electric, magnetic characterization, hardness…
Contact Task Facility Manager (TFM)
0472448151
Depending structure
Other's Laboratory/Plateforme
Laboratory : Plateforme AFM-SFA
Depending structure : ILM Tech
Federation :
Lab tutorship :
Federation :
FRAMA
Lab tutorship :
UCBL/CNRS
Rue Ada Byron
Bâtiment Brillouin - Campus de la DOUA
69622 Villeurbanne
Full support : 
Continuous education :
Access with light support :
Open to academic :
Open to enterprises :
Continuous education :
Access with light support :
Open to academic :
Open to enterprises :
